Michael G. Alles: search on Z-Library

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1

Incorporating big data in audits: Identifying inhibitors and a research agenda to address those inhibitors

Alles, Michael, Gray, Glen L.

Journal:

International Journal of Accounting Information Systems

Year:

2016

Language:

english

File:

PDF, 1.28 MB

english, 2016

2

The Remote Audit

Teeter, Ryan A., Alles, Michael G., Vasarhelyi, Miklos A.

Journal:

Journal of Emerging Technologies in Accounting

Year:

2010

Language:

english

File:

PDF, 223 KB

english, 2010

3

Continuous monitoring of business process controls: A pilot implementation of a continuous auditing system at Siemens

Michael Alles, Gerard Brennan, Alexander Kogan, Miklos A. Vasarhelyi

Journal:

International Journal of Accounting Information Systems

Year:

2006

Language:

english

File:

PDF, 869 KB

english, 2006

4

Ethics and governance

Journal:

International Journal of Disclosure and Governance

Year:

2009

Language:

english

File:

PDF, 46 KB

english, 2009

5

Immunomagnetic nanoscreening of circulating tumor cells with a motion controlled microfluidic system

Yu-yen Huang, Kazunori Hoshino, Peng Chen, Chun-hsien Wu, Nancy Lane, Michael Huebschman, Huaying Liu, Konstantin Sokolov, Jonathan W. Uhr, Eugene P. Frenkel, John X.J. Zhang…show all 11hide

Journal:

Biomedical Microdevices

Year:

2013

Language:

english

File:

PDF, 602 KB

english, 2013

6

Will XBRL improve corporate governance?

Alles, Michael, Piechocki, Maciej

Journal:

International Journal of Accounting Information Systems

Year:

2012

Language:

english

File:

PDF, 743 KB

english, 2012

7

Restoring auditor credibility: tertiary monitoring and logging of continuous assurance systems

Michael G. Alles, Alexander Kogan, Miklos A. Vasarhelyi

Journal:

International Journal of Accounting Information Systems

Year:

2004

Language:

english

File:

PDF, 155 KB

english, 2004

8

The evolution and future of XBRL research

Alles, Michael, Debreceny, Roger

Journal:

International Journal of Accounting Information Systems

Year:

2012

Language:

english

File:

PDF, 164 KB

english, 2012

9

Collaborative design research: Lessons from continuous auditing

Alles, Michael G., Kogan, Alexander, Vasarhelyi, Miklos A.

Journal:

International Journal of Accounting Information Systems

Year:

2013

Language:

english

File:

PDF, 281 KB

english, 2013

10

An Integrated Approach to Curriculum Design/Redesign

Lane, Michael S., Harpell, John, Mansour, All

Journal:

Journal of Education for Business

Year:

1986

Language:

english

File:

PDF, 2.47 MB

english, 1986

11

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Micro- and Nanotechnology Sensors, Systems, and Applications IV - High-power, military ruggedized QCL-based laser systems

Takeuchi, Eric B., George, Thomas, Islam, M. Saif, Chapman, William B., Arnone, David, Dutta, Achyut, Pushkarsky, Michael, Lopez, Enrique, Young, Michael, Caffey, Dave, Borgardt, Brandon, Priest, Alle

Year:

2012

Language:

english

File:

PDF, 4.51 MB

english, 2012

12

Reply to the discussions of “Restoring Auditor Credibility: Tertiary Monitoring and Logging of Continuous Assurance Systems”

Michael G. Alles, Alexander Kogan, Miklos A. Vasarhelyi

Journal:

International Journal of Accounting Information Systems

Year:

2004

Language:

english

File:

PDF, 46 KB

english, 2004

13

Exploiting comparative advantage: A paradigm for value added research in accounting information systems

Michael G. Alles, Alexander Kogan, Miklos A. Vasarhelyi

Journal:

International Journal of Accounting Information Systems

Year:

2008

Language:

english

File:

PDF, 191 KB

english, 2008

14

The “now” economy and the traditional accounting reporting model: Opportunities and challenges for AIS research

Miklos A. Vasarhelyi, Michael G. Alles

Journal:

International Journal of Accounting Information Systems

Year:

2008

Language:

english

File:

PDF, 406 KB

english, 2008

15

The case for process mining in auditing: Sources of value added and areas of application

Jans, Mieke, Alles, Michael, Vasarhelyi, Miklos

Journal:

International Journal of Accounting Information Systems

Year:

2013

Language:

english

File:

PDF, 378 KB

english, 2013

16

Adopting continuous auditing

Suresh Cuganesan, Dr. Jim Rooney, Prof., Sun, Ting, Alles, Michael, Vasarhelyi, Miklos A.

Journal:

Managerial Auditing Journal

Year:

2015

Language:

english

File:

PDF, 616 KB

english, 2015

17

Examining the role of the AIS research literature using the natural experiment of the 2018 JIS conference on cloud computing

Journal:

International Journal of Accounting Information Systems

Year:

2018

Language:

english

File:

PDF, 2.43 MB

english, 2018

18

The sensitivity of radiation-induced leakage to STI topology and sidewall doping

Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

19

Accurate numerical models for simulation of radiation events in nano-scale semiconductor devices

Alexander I. Fedoseyev, Marek Turowski, Michael L. Alles, Robert A. Weller

Journal:

Mathematics and Computers in Simulation

Year:

2008

Language:

english

File:

PDF, 1.57 MB

english, 2008

20

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Effect of carrier transport in oxides surrounding active devices on SEE in 45nm SOI SRAM

Turowski, Marek, Raman, Ashok, Alles, Michael L., Ball, Dennis, King, Michael P., Reed, Robert A., Schrimpf, Ron D.

Year:

2011

Language:

english

File:

PDF, 1.38 MB

english, 2011

21

The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies

Nadia Rezzak, Pierre Maillard, Ronald D. Schrimpf, Michael L. Alles, Daniel M. Fleetwood, Yanfeng Albert Li

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.22 MB

english, 2012

22

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Total-ionizing-dose radiation response of partially-depleted SOI devices

Rezzak, Nadia, Zhang, En Xia, Alles, Michael L., Schrimpf, Ronald D., Hughes, Harold

Year:

2010

Language:

english

File:

PDF, 1.09 MB

english, 2010

23

The acceptance and adoption of continuous auditing by internal auditors: A micro analysis

Vasarhelyi, Miklos A., Alles, Michael, Kuenkaikaew, Siripan, Littley, James

Journal:

International Journal of Accounting Information Systems

Year:

2012

Language:

english

File:

PDF, 429 KB

english, 2012

24

Evaluation of the pharmacodynamics and pharmacokinetics of the PARP inhibitor olaparib: a Phase I multicentre trial in patients scheduled for elective breast cancer surgery

Nigel Bundred, Janis Gardovskis, Janusz Jaskiewicz, Janis Eglitis, Viktor Paramonov, Peter McCormack, Helen Swaisland, Maria Cavallin, Tony Parry, James Carmichael, J. Michael Dixon…show all 11hide

Journal:

Investigational New Drugs

Year:

2013

Language:

english

File:

PDF, 289 KB

english, 2013

25

The Cancer Imaging Archive (TCIA): Maintaining and Operating a Public Information Repository

Kenneth Clark, Bruce Vendt, Kirk Smith, John Freymann, Justin Kirby, Paul Koppel, Stephen Moore, Stanley Phillips, David Maffitt, Michael Pringle, Lawrence Tarbox, Fred Prior…show all 12hide

Journal:

Journal of Digital Imaging

Year:

2013

Language:

english

File:

PDF, 636 KB

english, 2013

26

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Technology scaling and soft error reliability

Massengill, Lloyd W., Bhuva, Bharat L., Holman, W. Timothy, Alles, Michael L., Loveless, T. Daniel

Year:

2012

Language:

english

File:

PDF, 2.69 MB

english, 2012

27

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Olson, Brian D., Amusan, Oluwole A., Dasgupta, Sandeepan, Massengill, Lloyd W., Witulski, Arthur. F., Bhuva, Bharat L., Alles, Michael L., Warren, Kevin M., Ball, Dennis R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 245 KB

english, 2007

28

Total-ionizing-dose effects and reliability of carbon nanotube FET devices

Zhang, Cher Xuan, Zhang, En Xia, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Rutherglen, Chris, Galatsis, Kosmas

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 692 KB

english, 2014

29

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Alles, Michael L., Varadharajaperumal, Muthubalan, Niu, Guofu, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo, Krithivasan, Ramkum

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 706 KB

english, 2006

30

Dynamic Modeling of Radiation-Induced State Changes in ${\hbox {HfO}_2}/\hbox {Hf}$ 1T1R RRAM

Bennett, William G., Hooten, Nicholas C., Schrimpf, Ronald D., Reed, Robert A., Alles, Michael L., Zhang, En Xia, Weeden-Wright, Stephanie L., Linten, Dimitri, Jurczak, Malgorzata, Fantini, Andrea

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1015 KB

english, 2014

31

Information and Incentive Effects of Inventory in JIT Production

Alles, Michael, Amershi, Amin, Datar, Srikant, Sarkar, Ratna

Journal:

Management Science

Year:

2000

Language:

english

File:

PDF, 269 KB

english, 2000

32

Strategic Transfer Pricing

Alles, Michael, Datar, Srikant

Journal:

Management Science

Year:

1998

Language:

english

File:

PDF, 144 KB

english, 1998

33

Strategic Transfer Pricing

Michael Alles and Srikant Datar

Journal:

Management Science

Year:

1998

Language:

english

File:

PDF, 397 KB

english, 1998

34

[IEEE 2015 IEEE Radiation Effects Data Workshop (REDW) - Boston, MA, USA (2015.7.13-2015.7.17)] 2015 IEEE Radiation Effects Data Workshop (REDW) - Total Ionizing Dose Radiation Effects on 14 nm FinFET and SOI UTBB Technologies

Hughes, Harold, McMarr, Patrick, Alles, Michael, Zhang, Enxia, Arutt, Charles, Doris, Bruce, Liu, Derrick, Southwick, Richard, Oldiges, Philip

Year:

2015

Language:

english

File:

PDF, 4.14 MB

english, 2015

35

Thick data: adding context to big data to enhance auditability

Alles, Michael, Vasarhelyi, Miklos A.

Journal:

International Journal of Auditing Technology

Year:

2014

Language:

english

File:

PDF, 213 KB

english, 2014

36

SPIE Proceedings [SPIE SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics - Orlando, FL (Monday 17 April 1995)] Acquisition, Tracking, and Pointing IX - Signal processing for infrared scanning arrays and imagers

Alles, Paul, Evans, Robert H., Williams, Elmer F., Stockum, Larry A., Masten, Michael K., Stockum, Larry A.

Year:

1995

Language:

english

File:

PDF, 502 KB

english, 1995

37

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVII - Yokohama, Japan (Tuesday 13 April 2010)] Photomask and Next-Generation Lithography Mask Technology XVII - Results from a new 193nm die-to-database reticle inspection platform

Broadbent, William H., Hosono, Kunihiro, Alles, David S., Giusti, Michael T., Kvamme, Damon F., Shi, Rui-fang, Sousa, Weston L., Walsh, Robert, Xiong, Yalin

Year:

2010

Language:

english

File:

PDF, 477 KB

english, 2010

38

Information and Incentive Effects of Inventory in JIT Production

Michael Alles, Amin Amershi, Srikant Datar and Ratna Sarkar

Journal:

Management Science

Year:

2000

Language:

english

File:

PDF, 666 KB

english, 2000

39

Total Ionizing Dose Effects on Strained Ge pMOS FinFETs on Bulk Si

Zhang, En Xia, Fleetwood, Daniel M., Hachtel, Jordan A., Liang, Chundong, Reed, Robert A., Alles, Michael L., Schrimpf, Ronald D., Linten, Dimitri, Mitard, Jerome, Chisholm, Matthew F., Pantelides, So

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 583 KB

english, 2017

40

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Qin

Journal:

Semiconductor Science and Technology

Year:

2017

Language:

english

File:

PDF, 2.10 MB

english, 2017

41

Radiation Response and Adaptive Control-Based Degradation Mitigation of MEMS Accelerometers in Ionizing Dose Environments

Pitt, E. Bryn, Barth, Eric J., Diggins, Zachary J., Mahadevan, Nagabhushan, Karsai, Gabor, Sierawski, Brian D., Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Alles, Michael L., Witulski, Ar

Journal:

IEEE Sensors Journal

Year:

2017

Language:

english

File:

PDF, 2.75 MB

english, 2017

42

A Field Study on the Use of Process Mining of Event Logs as an Analytical Procedure in Auditing

Jans, Mieke, Alles, Michael G., Vasarhelyi, Miklos A.

Journal:

The Accounting Review

Year:

2014

Language:

english

File:

PDF, 460 KB

english, 2014

43

Polydimethylsiloxane Composites for Optical Ultrasound Generation and Multimodality Imaging

Noimark, Sacha, Colchester, Richard J., Poduval, Radhika K., Maneas, Efthymios, Alles, Erwin J., Zhao, Tianrui, Zhang, Edward Z., Ashworth, Michael, Tsolaki, Elena, Chester, Adrian H., Latif, Najma, B

Journal:

Advanced Functional Materials

Year:

2018

Language:

english

File:

PDF, 4.38 MB

english, 2018

44

Scaling Effects on Single-Event Transients in InGaAs FinFETs

Gong, Huiqi, Ni, Kai, Zhang, En Xia, Sternberg, Andrew L., Kozub, John A., Ryder, Kaitlyn L., Keller, Ryan F., Ryder, Landen D., Weiss, Sharon M., Weller, Robert A., Alles, Michael L., Reed, Robert A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 1.84 MB

english, 2018

45

Ultrasound Generation: Polydimethylsiloxane Composites for Optical Ultrasound Generation and Multimodality Imaging (Adv. Funct. Mater. 9/2018)

Noimark, Sacha, Colchester, Richard J., Poduval, Radhika K., Maneas, Efthymios, Alles, Erwin J., Zhao, Tianrui, Zhang, Edward Z., Ashworth, Michael, Tsolaki, Elena, Chester, Adrian H., Latif, Najma, B

Journal:

Advanced Functional Materials

Year:

2018

File:

PDF, 2.43 MB

2018

46

Regional oxygen extraction predicts border zone vulnerability to stroke in sickle cell disease

Fields, Melanie E., Guilliams, Kristin P., Ragan, Dustin K., Binkley, Michael M., Eldeniz, Cihat, Chen, Yasheng, Hulbert, Monica L., McKinstry, Robert C., Shimony, Joshua S., Vo, Katie D., Doctor, All

Journal:

Year:

2018

Language:

english

File:

PDF, 454 KB

english, 2018

47

Human glial-restricted progenitors survive, proliferate, and preserve electrophysiological function in rats with focal inflammatory spinal cord demyelination

Piotr Walczak, Angelo H. All, Nidhi Rumpal, Michael Gorelik, Heechul Kim, Anil Maybhate, Gracee Agrawal, James T. Campanelli, Assaf A. Gilad, Douglas A. Kerr, Jeff W. M. Bulte

Journal:

Year:

2011

Language:

english

File:

PDF, 7.58 MB

english, 2011

48

Advanced manufacturing of SIMOX for low power electronics

Michael Alles, Wade Krull

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 553 KB

english, 1996

49

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

Akil. K. Sutton, Kurt Moen, John D. Cressler, Martin A. Carts, Paul W. Marshall, Jonathan A. Pellish, Vishwa Ramachandran, Robert A. Reed, Michael L. Alles, Guofu Niu

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 1.56 MB

english, 2008

50

Application of a novel test system to characterize single-event effects at cryogenic temperatures

Vishwanath Ramachandran, Matthew J. Gadlage, Jonathan R. Ahlbin, Balaji Narasimham, Michael L. Alles, Robert A. Reed, Bharat L. Bhuva, Lloyd W. Massengill, Jeffrey D. Black, Christopher N. Foster

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.42 MB

english, 2010

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